我跑了s.m.a.r.t并想出了一些奇怪的错误,虽然磁盘非常新鲜Power_On_Minutes 427h 41m
我很好奇,这些是以前硬盘的错误吗？
Error 1 occurred at disk power-on lifetime: 13729 hours (572 days + 1 hours) When the command that caused the error occurred,the device was active or idle Error 2 occurred at disk power-on lifetime: 23300 hours (970 days + 20 hours) When the command that caused the error occurred,the device was active or idle.
这是输出
# smartctl --all /dev/sda
smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-51-generic] (local build)
copyright (C) 2002-16,Bruce Allen,Christian Franke,www.smartmontools.org
=== START OF informatION SECTION ===
Model Family: Toshiba 2.5" HDD MK..76GSX
Device Model: TOSHIBA MK2576GSX
Serial Number: Y1J9S0IGS
LU WWN Device Id: 5 000039 3a5a06b8e
Firmware Version: GS001A
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 2.6,3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Thu Dec 1 00:28:22 2016 GMT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: disabled.
Self-test execution status: ( 0) The prevIoUs self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 81) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_Failed RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1229
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 15
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Minutes 0x0032 036 036 000 Old_age Always - 427h+41m
10 Spin_Retry_Count 0x0033 100 100 030 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 7
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 1
193 Load_Cycle_Count 0x0032 070 070 000 Old_age Always - 304324
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 27 (Min/Max 20/31)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 2
220 disk_Shift 0x0002 100 100 000 Old_age Always - 109
222 Loaded_Hours 0x0032 067 067 000 Old_age Always - 13230
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 375
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 2
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on,and printed as
DDd+hh:mm:SS.sss where DD=days,hh=hours,mm=minutes,SS=sec,and sss=millisec. It "wraps" after 49.710 days.
Error 2 occurred at disk power-on lifetime: 23300 hours (970 days + 20 hours)
When the command that caused the error occurred,the device was active or idle.
After command completion occurred,registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 1f 7a 05 e0 Error: ICRC,ABRT 1 sectors at LBA = 0x00057a1f = 358943
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 00 20 76 05 e0 00 6d+01:49:26.915 WRITE DMA EXT
35 00 00 00 72 05 e0 00 6d+01:49:26.741 WRITE DMA EXT
35 00 08 80 0f 0c e0 00 6d+01:49:26.741 WRITE DMA EXT
35 00 08 48 8a c4 e0 00 6d+01:49:26.741 WRITE DMA EXT
ca 00 08 00 08 14 e9 00 6d+01:49:26.741 WRITE DMA
Error 1 occurred at disk power-on lifetime: 13729 hours (572 days + 1 hours)
When the command that caused the error occurred,registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 3f 8c 4e e0 Error: ICRC,ABRT 1 sectors at LBA = 0x004e8c3f = 5147711
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 00 40 88 4e e0 00 12d+21:23:20.732 WRITE DMA EXT
ca 00 08 a8 48 c8 e3 00 12d+21:23:20.731 WRITE DMA
35 00 08 40 c1 1d e0 00 12d+21:23:20.731 WRITE DMA EXT
35 00 08 b0 19 14 e0 00 12d+21:23:20.731 WRITE DMA EXT
35 00 10 28 bf 13 e0 00 12d+21:23:20.731 WRITE DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests,use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans,do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up,resume after 0 minute delay.
这个硬盘可能很快就会发生故障并需要更换吗？
